X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291.15 14-14.5% (w/v) PEG 3350 200mM sodium malonate pH 6.8-7.0
Unit Cell:
a: 185.070 Å b: 185.070 Å c: 185.070 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 21 3
Crystal Properties:
Matthew's Coefficient: 4.07 Solvent Content: 69.74
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SIRAS FREE R-VALUE 2.7500 46.2670 27492 1374 99.9700 0.2378 0.2558 109.0360
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.75 46.267 100 ? 0.09 32.2 39.8 ? 27492 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.75 2.82 100 ? ? 1.9 40.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.0 SLS X06DA
Software
Software Name Purpose Version
XSCALE data scaling .
SHELXDE phasing .
PHENIX refinement 1.9_1692
PDB_EXTRACT data extraction 3.20
XDS data reduction .