X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 300 100 mM BisTris, 200 mM NaCl, 5 mM YbCl3, 9-11% PEG3350
Unit Cell:
a: 109.064 Å b: 109.064 Å c: 83.178 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 4 2 2
Crystal Properties:
Matthew's Coefficient: 2.27 Solvent Content: 45.92
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 1.70 48.78 51675 2762 97.6 0.219 0.238 37.47
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.700 50.000 97.6 0.07700 ? 9.6000 6.400 ? 54446 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.70 1.73 97.0 ? ? 6.30
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.98 APS 19-ID
Software
Software Name Purpose Version
REFMAC refinement 5.8.0049
PDB_EXTRACT data extraction 3.20
HKL-3000 data reduction .
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