5L2A

X-RAY DIFFRACTION


Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 290 50 mM Mg(OAc)2, 30% PEG400
Unit Cell:
a: 119.079 Å b: 119.079 Å c: 276.962 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 61
Crystal Properties:
Matthew's Coefficient: 4.24 Solvent Content: 70.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.450 38.978 53483 3750 92.49 0.2746 0.3067 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.45 40 99.6 ? ? 5.6 5.8 ? 53483 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.45 3.66 99.5 ? ? 0.5 5.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.97910 APS 24-ID-C
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
iMOSFLM data reduction 7.2.1
Aimless data scaling .
PHASER phasing .