X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7 293 20% PEG 3350, 0.1 M Sodium Acetate pH 7
Unit Cell:
a: 55.100 Å b: 55.506 Å c: 70.075 Å α: 71.56° β: 79.75° γ: 81.09°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.01 Solvent Content: 38.71
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.59 65.84 19537 1052 85.88 0.17719 0.24733 53.771
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.59 65.84 98.4 ? ? 7.1 1.1 ? 23660 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 . ? ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 133 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-G 1.00 APS 21-ID-G
Software
Software Name Purpose Version
REFMAC refinement 5.8.0135
HKL-2000 data reduction .
HKL-2000 data scaling .
PHASER phasing .