X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 277 0.1 M HEPES, 27.5 % 2-methyl-2,4-pentanediol, 0.2 M NaCl
Unit Cell:
a: 60.342 Å b: 92.994 Å c: 101.849 Å α: 71.12° β: 84.57° γ: 73.48°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.06 Solvent Content: 59.85
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.729 49.664 52529 2000 98.34 0.1980 0.2405 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.729 49.664 98 0.0318 ? 14.84 2.0 ? 52550 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.729 2.827 94 ? ? 2.55 1.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 80 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.2 1 ALS 8.2.2
Software
Software Name Purpose Version
PHENIX refinement 1.10_2155
HKL-2000 data reduction v712
HKL-2000 data scaling v712
PHENIX phasing 1.10_2155