X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 295 0.15 M MgSO4, 0.1 M MES pH 6.5, 25% (w/v) PEG3350, 10 mM NaSCN
Unit Cell:
a: 51.759 Å b: 54.631 Å c: 94.096 Å α: 99.800° β: 94.820° γ: 99.170°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.04 Solvent Content: 59.6
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.2800 46.7750 239913 11850 93.3900 0.2113 0.2359 28.0031
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.28 46.7750 93 0.07663 ? 4.99 1.8 ? 242310 ? ? 14.080
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.28 1.326 94 ? ? 0.27 1.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I02 0.7749 Diamond I02
Software
Software Name Purpose Version
PHENIX refinement dev_2712
XDS data reduction .
XDS data scaling .
PHENIX phasing .
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