ELECTRON MICROSCOPY

Sample

filament

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument
Cryogen Name
Sample Vitrification Details
3D Reconstruction
Reconstruction Method HELICAL
Number of Particles 69000
Reported Resolution (Å) 4.2
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type HELICAL
Map-Model Fitting and Refinement
ID
Refinement Space
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector Type FEI FALCON II (4k x 4k)
Electron Dose (electrons/Å2) 20
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) ?
Maximum Defocus (nm) ?
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode DIFFRACTION
Specimen Holder Model ?
Nominal Magnification ?
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION RELION ?
CTF CORRECTION Gctf ?
MODEL FITTING Coot ?
MODEL REFINEMENT REFMAC ?
CLASSIFICATION RELION ?
RECONSTRUCTION RELION ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
NONE ?