X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 295 0.15M Ammonium Sulfate, 0.1M Tris pH 7.0, 10% PEG 4000
Unit Cell:
a: 74.595 Å b: 79.105 Å c: 80.838 Å α: 107.27° β: 90.71° γ: 111.20°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.15 Solvent Content: 60.95
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.610 44.841 47363 2324 95.47 0.1876 0.2420 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.60 50.0 96.4 .062 ? 21.30 2.0 ? 47380 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.60 2.64 97.4 ? ? 2.53 2.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.3.1 1 ALS 8.3.1
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
HKL-2000 data reduction .
SCALEPACK data scaling .
PHASER phasing .