ISDA

5JRJ

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.8	293.15	Single crystals were obtained with 0.25 M CaCl2 and 14% w/v PEG 3350 with addition of Polypropylene glycol P 400 (PPG 400) onto the drop to give a final concentration of 5-8% w/v.

Unit Cell:

a: 87.410 Å b: 87.410 Å c: 91.353 Å α: 90.00° β: 90.00° γ: 120.00°

Symmetry:

Space Group: P 61

Crystal Properties:

Matthew's Coefficient: 2.69 Solvent Content: 54.2

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	1.700	31.578	42571	2024	97.66	0.1772	0.2107	23.30

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.70	31.578	97.67	0.0467	?	31.03	5.18	?	42574	?	?	16.94

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.70	1.73	79.5	?	?	2.08	1.83	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
ROTATING ANODE	BRUKER AXS MICROSTAR	1.54	?	?

Software