X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 10% PEG20000, 20% PEG550MME, 0.1 M Mops/Hepes pH 7.5, 0.1 M MgCl2
Unit Cell:
a: 63.500 Å b: 63.500 Å c: 145.220 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 41 2 2
Crystal Properties:
Matthew's Coefficient: 2.07 Solvent Content: 40.52
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.195 47.800 5296 549 98.57 0.2753 0.3062 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.195 47.8 95.5 0.062 ? 21.6 6.5 ? 5296 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.195 3.3 93.1 ? ? 2.2 6.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 1.00000 SLS X06SA
Software
Software Name Purpose Version
PHENIX refinement (1.10pre_2131: ???)
XDS data reduction .
XSCALE data scaling .
PHASER phasing .
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