X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6 277 7% PEG 5000MME, 100mM Bis-Tris pH 6, 1.5% Tacsimate pH 6
Unit Cell:
a: 42.210 Å b: 63.551 Å c: 73.664 Å α: 100.60° β: 90.61° γ: 90.96°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.97 Solvent Content: 62.49
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.153 36.239 38408 1999 94.19 0.1695 0.2156 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.153 36.24 94.20 0.06834 ? 14.19 3.9 ? 38412 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.153 2.23 87.83 ? ? 6.43 3.9 3992
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 1.075 NSLS X29A
Software
Software Name Purpose Version
HKL-2000 data scaling .
PHASER phasing 2.5.6
PHENIX refinement 1.9_1692