X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 290 0.26 M ammonium phosphate monobasic, 35% v/v glycerol
Unit Cell:
a: 87.720 Å b: 125.748 Å c: 118.728 Å α: 90.000° β: 109.170° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.49 Solvent Content: 50.56
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.0360 49.5400 154489 1996 99.5200 0.1669 0.2094 27.7174
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.040 50.000 99.700 0.124 ? 6.700 7.400 ? 154549 ? ? 24.120
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.040 2.080 94.200 ? ? ? 6.100 7236
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.1 1 ALS 5.0.1
Software
Software Name Purpose Version
PHENIX refinement 1.8_1069
HKL-2000 data collection .
HKL-2000 data reduction .
PHENIX model building 2.5.5
PDB_EXTRACT data extraction 3.15
SCALEPACK data scaling .
PHASER phasing .
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