X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 278 0.2 M Sodium Fluoride, 0.1 M MES pH 5.5 , 20 % PEG 400
Unit Cell:
a: 72.670 Å b: 72.670 Å c: 88.240 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 3
Crystal Properties:
Matthew's Coefficient: 1.98 Solvent Content: 37.94
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.360 51.237 21249 1091 99.05 0.2465 0.2688 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.36 51.24 99 0.148 ? 12 6.4 ? 21259 ? ? 22.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.36 ? 99.8 ? ? 2.4 6.4 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.1 1.0 ALS 8.2.1
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
xia2 data reduction .
xia2 data scaling .
PHASER phasing .