ELECTRON MICROSCOPY

Sample

Hexagonal pre-attachment T4 baseplate-tail tube complex

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details Applied 3.5 ul of sample and blotting 3 seconds before plunging
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 37913
Reported Resolution (Å) 4.11
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol AB INITIO MODEL
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å2) 60
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 500
Maximum Defocus (nm) 4000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 105000
Calibrated Magnification 37700
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION EMAN 2
CTF CORRECTION CTFFIND 4
CTF CORRECTION RELION 1.4
MODEL FITTING Coot 0.8.2
INITIAL EULER ASSIGNMENT RELION 1.4
FINAL EULER ASSIGNMENT RELION 1.4
RECONSTRUCTION RELION 1.4
MODEL REFINEMENT PHENIX 1.10.1-2155
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?