X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 277 30% PEG 550 MME, 30% PEG 2000 MME, Morpheus buffer 1 pH 6.5 and Morpheus carboxylic acids
Unit Cell:
a: 164.856 Å b: 164.856 Å c: 48.001 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 63 2 2
Crystal Properties:
Matthew's Coefficient: 3.55 Solvent Content: 65.33
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.0200 47.5900 7403 392 92.5100 0.2416 0.2886 71.4027
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.010 142.598 91.400 ? 0.103 15.000 11.300 ? 7413 ? ? 76.140
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.010 3.170 51.200 ? ? 2.200 1.600 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 0.9999 SLS X06DA
Software
Software Name Purpose Version
PHENIX refinement 1.19.2_4158
iMOSFLM data reduction .
SCALA data scaling 3.3.22
PHASER phasing .
PDB_EXTRACT data extraction 3.20