ISDA: 5I8Q

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	?	292	Crystallization buffer was prepared by mixing a solution containing 100 mM MES-NaOH, pH 6.0, 100 mM NaOAc, 8% PEG 10K and an additive solution (20% acetonitrile, 5% n-Dodecyl-?-D-maltoside) in a 5:1 (v:v).Microbatch drops were formed by mixing 1.8 ?l of the crystallization buffer with 1.2 ?l of the preformed complex

Unit Cell:

a: 168.063 Å b: 154.031 Å c: 78.988 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 21 21 2

Crystal Properties:

Matthew's Coefficient: 2.86 Solvent Content: 57.01

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	4.200	29.446	15493	1573	99.85	0.2629	0.2861	?

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
4.200	30	99.500	0.255	?	8.670	6.05	?	15735	?	-3.000	121.220

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	4.200	4.340	99.900	?	?	2.080	?	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	MAX II BEAMLINE I911-3	1.00	MAX II	I911-3

Software