X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 reservoir contained 0.2 M ammonium acetate, 0.1M BisTris pH 5.5, 45% MPD
Unit Cell:
a: 29.460 Å b: 10.510 Å c: 29.710 Å α: 90.000° β: 111.980° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.61 Solvent Content: 23.48
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO PHASING THROUGHOUT 1.4500 16.5500 2812 313 96.6900 0.1466 0.1837 16.9580
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.450 16.55 96.200 0.124 ? 10.010 18.97 ? 3126 ? -3.000 18.998
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.450 1.490 87.600 ? ? 3.780 19.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.9792,0.9794,0.9796 APS 24-ID-C
Software
Software Name Purpose Version
REFMAC refinement 5.7.0029
XSCALE data scaling .
PDB_EXTRACT data extraction 3.20
XDS data reduction .
Arcimboldo phasing .
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