X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 293 1.1 M AMMONIUM TARTRATE
Unit Cell:
a: 211.245 Å b: 211.245 Å c: 53.164 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 64
Crystal Properties:
Matthew's Coefficient: 4.14 Solvent Content: 70.3
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 4.451 52.811 8611 847 99.73 0.2888 0.3181 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
4.301 52.811 100.0 0.395 ? 3.5 9.5 ? 9558 ? ? 219.00
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 4.301 4.81 100.0 ? ? 0.6 9.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I02 0.97938 Diamond I02
Software
Software Name Purpose Version
PHENIX refinement (1.10.1_2155: ???)
DIALS data reduction 1.dev.176
Aimless data scaling 0.525
PHASER phasing (2.5.6)