X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 290 Morpheus Screen E8: 0.12 M Ethylene Glycols (equimolar mix of di- tri- tetra- and penta-ethylene glycol) 0.1M Buffer System 2 pH 7.5 (Na Hepes and MOPS acid), 50% Precipitant mix 4 (25% MPD, 25% PEG1000, 25% PEG3350); BuamA.00078.a.B1.PS02512 at 52.5 mg/ml
Unit Cell:
a: 41.500 Å b: 63.310 Å c: 99.180 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.21 Solvent Content: 44.46
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.8000 39.04 24921 2147 99.9500 0.1567 0.1950 21.2123
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.800 39.04 100.000 0.053 ? 30.590 9.7 ? 24922 ? -3.000 17.020
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.800 1.850 99.900 ? ? 3.560 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E+ SUPERBRIGHT 1.5418 ? ?
Software
Software Name Purpose Version
PHENIX refinement dev_2299
XSCALE data scaling .
PDB_EXTRACT data extraction 3.20
XDS data reduction .