X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.7 297 CO-CRYSTALLIZING 20 MG ML HEWL WITH 1.4 MG CARBOPLATIN IN 75 MicroL DMSO, 462.5 MicroL 0.1 M SODIUM ACETATE, 462.5 MicroL 1 M NABR SOLUTION., PH 4.7, BATCH MODE, TEMPERATURE 297K .
Unit Cell:
a: 78.58 Å b: 78.58 Å c: 37.29 Å α: 90.0° β: 90.0° γ: 90.0°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 1.92 Solvent Content: 35.86
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.29990102989 39.29 23088 2183 79.0935246558 0.166638373527 0.214997648104 19.8326076049
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.30 39.29 79.09 0.095 ? 4.59 10.8 ? 23088 ? ? 14.8164861805
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.30 1.346 31.05 ? ? 0.23 2.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I04 0.9163 Diamond I04
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692+SVN
PHASER phasing .
EVAL data scaling .
EVAL data reduction .
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