X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.7 293 25% PEG 550 MME, 10% 2-propanol, 5% ethylene glycol, 100 mM sodium acetate pH 4.7, and 100 mM calcium chloride.
Unit Cell:
a: 193.103 Å b: 193.103 Å c: 350.320 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: H 3
Crystal Properties:
Matthew's Coefficient: 3.79 Solvent Content: 67.55
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.3000 48.2760 73143 3688 99.8600 0.2284 0.2584 144.6901
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.300 48.280 99.900 0.100 ? 7.000 3.890 ? 73208 ? ? 124.670
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.300 3.420 100.000 ? ? 1.300 3.880 7325
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 80 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 1.03316 APS 23-ID-D
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
d*TREK data scaling 9.9.9.6L
PHASER phasing 2.5.4
PDB_EXTRACT data extraction 3.15
d*TREK data reduction .