X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 289 21% (w/v)5000 MME, 0.1M MES
Unit Cell:
a: 55.333 Å b: 61.821 Å c: 88.331 Å α: 97.840° β: 100.510° γ: 90.270°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.06 Solvent Content: 40.17
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.3000 30.6080 45927 2355 90.7700 0.2021 0.2483 22.2400
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3000 50 96.7 0.073 ? 10.9 1.9 ? 48501 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.38 97.3 ? ? 2.03 2.0 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.9793 SSRF BL17U
Software
Software Name Purpose Version
PHENIX refinement 1.8.1_1168
HKL-2000 data collection .
HKL-2000 data scaling .
PHASER phasing .
PDB_EXTRACT data extraction 3.20
HKL-2000 data reduction .
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