X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 289 Tacsimate, HEPES, PEG3350
Unit Cell:
a: 62.938 Å b: 67.903 Å c: 89.723 Å α: 109.33° β: 89.82° γ: 90.32°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.12 Solvent Content: 60.56
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.01 30.00 84363 4470 94.87 0.17847 0.21356 28.445
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.00 30.00 95.9 ? 0.11 23.5 3.2 ? 88839 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.07 94.2 ? ? 5.3 3.0 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 1.0 SSRF BL17U
Software
Software Name Purpose Version
REFMAC refinement 5.8.0131
HKL-2000 data reduction .
HKL-2000 data scaling .
PHASER phasing .
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