ELECTRON MICROSCOPY

Sample

RECOMBINANT YEAST GAMMA- TUSC MUTANT S58C G288C

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument FEI VITROBOT MARK I
Cryogen Name ETHANE
Sample Vitrification Details CRYOGEN- ETHANE, HUMIDITY- 90, INSTRUMENT- FEI VITROBOT MARK I, METHOD- BLOT FOR 2-5 SECONDS BEFORE PLUNGING,
3D Reconstruction
Reconstruction Method HELICAL
Number of Particles ?
Reported Resolution (Å) 6.9
Resolution Method ?
Other Details INITIAL MODELS WERE GENERATED WITH MODELER 9.15 BASED ON PDB ENTRIES 3RIP (FOR GCP2 AND GCP3) AND 3CB2 (FOR GAMMA TUBULIN). TWO COMPLETE GAMMA-TUSC STRUCTURES WERE MODELED SIMULTANEOUSLY, RIGIDLY FITTED INTO THE CRYO-EM MAP WITH UCSF CHIMERA, THEN FLEXIBLY FITTED WITH MDFF. ADDITIONAL SECONDARY STRUCTURE AND SYMMETRY RESTRAINTS WERE ADDED. FINAL VALIDATION PERFORMED WITH THE INTEGRATIVE MODELING PLATFORM. FOR DETAILS, ALL CODE IS DEPOSITED AT GITHUB.COM/INTEGRATIVEMODELING/GAMMA-TUSC SUBMISSION BASED ON EXPERIMENTAL DATA FROM EMDB EMD-2799. (DEPOSITION ID: 12869).
Refinement Type
Symmetry Type HELICAL
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details METHOD--FLEXIBLE FITTING
Data Acquisition
Detector Type TVIPS TEMCAM-F816 (8k x 8k)
Electron Dose (electrons/Å2) 20
Imaging Experiment
Date of Experiment 2011-05-25
Temprature (Kelvin)
Microscope Model FEI TECNAI F20
Minimum Defocus (nm) 800
Maximum Defocus (nm) 2000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.12
Imaging Mode BRIGHT FIELD
Specimen Holder Model .
Nominal Magnification ?
Calibrated Magnification 94000
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details ?
Imaging Experiment
Task Software Package Version
CTF CORRECTION CTFFIND ?
MODEL FITTING MDFF ?
MODEL FITTING MODELLER ?
RECONSTRUCTION EMAN 1
RECONSTRUCTION SPIDER ?
SYMMETRY DETERMINATION hsearch_lorentz ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
? EACH MICROGRAPH