X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 298.15 7.5% PEG4000 12.5% Isopropanol 0.1M Sodium Citrate pH5.6 Cryoprotectant: 30% Ethylene Glycol
Unit Cell:
a: 43.002 Å b: 68.280 Å c: 85.731 Å α: 95.59° β: 99.82° γ: 102.54°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.48 Solvent Content: 50.47
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.7842 41.822 20492 1023 88.13 0.2309 0.2786 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.78 50.000 88.900 0.108 ? 6.400 1.900 ? 20522 ? ? 50.767
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.78 2.850 57.900 ? ? 1.44 1.600 670
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.0 APS 22-ID
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
HKL-2000 data collection .
HKL-2000 data scaling .
PHASER phasing 2.5.6
PDB_EXTRACT data extraction 3.15
HKL-2000 data reduction .