X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291 0.1M phosphate/citrate, 40%(v/v) PEG300
Unit Cell:
a: 30.485 Å b: 43.780 Å c: 44.726 Å α: 77.32° β: 86.78° γ: 85.34°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.29 Solvent Content: 46.27
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.502 27.633 34342 1726 95.76 0.1725 0.1894 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.50 50.00 96.1 0.057 0.057 24.140 3.2 ? 34370 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.5 1.55 94.6 ? 0.283 5.820 2.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.97892 SSRF BL17U
Software
Software Name Purpose Version
HKL-2000 data processing .
SCALEPACK data scaling .
PHASER phasing .
Coot model building .
PHENIX refinement 1.9_1692
HKL-2000 data reduction .
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