X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 0.05 M Ammonium Sulfate, 0.05 M Bis-Tris:HCl pH 6.5, 30% (v/v) Pentaerythritol Ethoxylate (15/4 EO/OH), 0.1 M Sodium formate pH 7.0, 12% w/v Polyethylene glycol 3350
Unit Cell:
a: 82.340 Å b: 75.000 Å c: 232.860 Å α: 90.000° β: 95.140° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.22 Solvent Content: 44.62
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? FREE R-VALUE 2.6000 48.81 87511 1999 99.9700 0.3036 0.3491 59.5763
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 48.81 99.98 ? ? 6.67 7.6 ? 87516 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.6 2.693 99.87 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 0.979 CLSI 08ID-1
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
PDB_EXTRACT data extraction 3.15
HKL-2000 data scaling .
PHENIX phasing 1.9_1692
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