X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 0.1 M Mes pH 6.5, 1.8 M Ammonium Sulphate, 5% (w/v) PEG400, 0.1% (w/v) octyl-beta-D-glucopyranoside. Crystals were soaked with precipitant solution supplemented with 0.5 M Potassium Iodide
Unit Cell:
a: 61.911 Å b: 61.911 Å c: 66.490 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 31 2 1
Crystal Properties:
Matthew's Coefficient: 2.33 Solvent Content: 47.28
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.4030 41.7370 11066 652 99.4800 0.1903 0.2213 55.2479
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.40 41.74 99.8 0.161 0.172 14.9 14.7 89114 6054 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.40 2.49 98.1 ? ? 1.7 13.9 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ELETTRA BEAMLINE 5.2R 2.0 ELETTRA 5.2R
Software
Software Name Purpose Version
PHENIX refinement .
PDB_EXTRACT data extraction 3.15
XDS data reduction .
Aimless data scaling .
PHASER phasing .