X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.0 295 16-18% PEG600 (v/v), 0.12 M Tris/HCl, pH 9.0, 0.1 M NaCl and 1 mM TCEP
Unit Cell:
a: 157.331 Å b: 137.518 Å c: 101.448 Å α: 90.000° β: 98.500° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 3.45 Solvent Content: 64.35
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? FREE R-VALUE 3.1940 19.9880 34875 1724 98.7000 0.2501 0.2910 165.9240
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.100 19.988 96.900 0.052 ? 12.800 2.600 ? 36869 ? ? 126.120
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.100 3.240 96.900 ? ? 0.800 2.600 4503
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4C 0.979 NSLS X4C
Software
Software Name Purpose Version
PHENIX refinement dev_2210
Aimless data scaling 0.5.17
PDB_EXTRACT data extraction 3.15
iMOSFLM data reduction .