X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 100 K | ? |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | BRUKER AXS MICROSTAR | 1.541790 | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| XDS | data reduction | 17 jun 2015 |
| XDS | data scaling | 17 jun 2015 |
| PHASER | phasing | 2.5.6 |
| REFMAC | refinement | 5.8.0131 |
