X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 0.1 M Bis-Tris, pH 6.5, 25.5% PEG 3350, 0.35 M MgCl2
Unit Cell:
a: 50.780 Å b: 81.820 Å c: 93.140 Å α: 74.08° β: 84.26° γ: 76.89°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.52 Solvent Content: 51.12
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.000 46.186 89772 4489 94.73 0.1966 0.2474 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.0 49.4 96 ? ? 13.0 1 ? 90134 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 . ? ? ? ? 1.70 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.9998 SLS X10SA
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
XDS data reduction .
XDS data scaling .
PHASER phasing .