X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291 20% PEG 3350, 0.2 M dibasic sodium phosphate
Unit Cell:
a: 65.149 Å b: 27.744 Å c: 73.347 Å α: 90.00° β: 100.19° γ: 90.00°
Symmetry:
Space Group: P 1 21/c 1
Crystal Properties:
Matthew's Coefficient: 2.35 Solvent Content: 47.59
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.600 34.142 32502 1618 97.41 0.2376 0.2834 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 34.142 97.7 ? ? 10.5 5.8 ? 33736 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.60 1.63 95.1 ? ? 1.5 6.0 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON AUSTRALIAN SYNCHROTRON BEAMLINE MX2 1.4586 Australian Synchrotron MX2
Software
Software Name Purpose Version
PHENIX refinement (1.10_2155: ???)
Aimless data scaling 0.3.11
XDS data reduction November 3, 2014
PHASER phasing 2.5.6