ISDA: 5DVW

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.5	290	Molecular Dimensions Morpheus screen e12: 40mM each Di-Ethyleneglycol, Tri-Ethyleneglycol, TetraEthyleneglycol, Penta-Ethyleneglycol; 12.% each MPD, PEG 1000; PEG 3350; 100mM Tris(base)/Bicine pH 8.5; EbzaA.17250.a.EW11.PD00370 at 22 mg/ml, tray 262514e12, puck otj5-3; cryo: direct

Unit Cell:

a: 34.090 Å b: 58.380 Å c: 66.600 Å α: 96.330° β: 90.110° γ: 106.980°

Symmetry:

Space Group: P 1

Crystal Properties:

Matthew's Coefficient: 2.08 Solvent Content: 41

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	1.7500	24.5790	47109	2363	95.6900	0.1686	0.2078	21.9758

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.750	50	95.700	0.073	?	8.900	2.4	?	47118	?	-3.000	16.990

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.750	1.800	95.600	?	?	1.960	2.4	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 21-ID-G	0.97856	APS	21-ID-G

Software