X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 298 0.1M MES sodium salt pH 6.5, 2.0M Ammonium sulfate, 5% w/v PEG 400
Unit Cell:
a: 67.870 Å b: 67.870 Å c: 26.480 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 6
Crystal Properties:
Matthew's Coefficient: 1.79 Solvent Content: 31.20
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.5000 58.7800 11398 1140 99.9400 0.1935 0.2188 21.8900
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.500 58.78 99.900 0.062 ? 18.080 9.2 ? 11398 ? -3.000 18.610
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.500 1.540 99.500 ? ? 2.790 5.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.97950 APS 24-ID-C
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.5.6
BUSTER-TNT refinement .
PDB_EXTRACT data extraction 3.15
XDS data reduction .