X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 292 1.5M Ammonium sulfate
Unit Cell:
a: 40.539 Å b: 72.940 Å c: 79.008 Å α: 117.510° β: 104.900° γ: 89.910°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.88 Solvent Content: 68.33
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.9000 17.9020 56881 2946 93.9300 0.2105 0.2248 16.6386
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.900 67.083 95.600 ? 0.066 9.000 3.000 57986 57986 ? ? 9.250
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.900 2.000 94.600 ? 0.165 3.300 3.100 8396
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.000010 SLS X06DA
Software
Software Name Purpose Version
MOSFLM data reduction 3.3.21
SCALA data scaling 3.3.21
PHASER phasing .
PHENIX refinement .
PDB_EXTRACT data extraction 3.15
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