X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 298 10% PEG 5000 MME, 0.1 M Hepes pH 7.0, 5% tacsimate pH 7.0
Unit Cell:
a: 159.271 Å b: 198.950 Å c: 261.550 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 2.97 Solvent Content: 58.57
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 3.1000 47.7530 73264 2606 97.2400 0.2349 0.2682 96.0727
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.1000 130.775 97.800 ? 0.109 7.400 3.300 73294 73294 ? ? 79.500
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.100 3.270 99.300 ? 0.482 1.500 3.300 10812
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 1.0391 SSRF BL17U
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
HKL-2000 data collection .
SCALA data scaling 3.3.21
PDB_EXTRACT data extraction 3.15
MOSFLM data reduction 7.2.0
PHENIX phasing 1.9-1692