X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 290 complex + well mixed 1:1 complex: 3mg/ml in 25mM tris pH 7.5 and 0.14M (NH4)2SO4 well: 16% PEG3350, 0.2M ammonium flouride cryoprotectant: added 20% ethylene glycol
Unit Cell:
a: 144.900 Å b: 151.920 Å c: 106.140 Å α: 90.00° β: 99.85° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 4.82 Solvent Content: 74.49
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 4.000 49.247 19059 968 99.27 0.2094 0.2498 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
4.0 100.0 99.5 ? ? 22.9 3.5 19099 19099 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 4.00 4.07 96 ? ? 1 2.6 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 80 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97948 APS 19-ID
Software
Software Name Purpose Version
PHENIX refinement dev_2067
HKL-2000 data reduction .
HKL-2000 data scaling .
MOLREP phasing .
PHASER phasing .