X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 292 well + complex mixed 1:1 complex: 6mg/ml in 25mM tris pH 7.5, 0.18M (NH4)2SO4 well: 20% PEG3350, 0.2M sodium malonate pH 7.0 microseeding required cryoprotectant: crop conditions plus 20% PEG400 and 10% glycerol
Unit Cell:
a: 77.313 Å b: 77.313 Å c: 272.277 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 3.31 Solvent Content: 62.79
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR FREE R-VALUE 3.400 29.427 12089 575 99.90 0.2506 0.2919 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.4 100.0 99.9 ? ? 34.2 7.6 ? 12184 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.40 3.46 99.8 ? ? 1.5 6.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 80 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97948 APS 19-ID
Software
Software Name Purpose Version
PHENIX refinement dev_2067
HKL-2000 data reduction .
HKL-2000 data scaling .
SHELXDE phasing .
SOLVE phasing .
Coot model building .