X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 295 0.1 M HEPES, 50 mM sodium acetate, 17% PEG 3,350
Unit Cell:
a: 27.890 Å b: 55.920 Å c: 62.100 Å α: 90.00° β: 92.86° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.30 Solvent Content: 46.45
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.5991 41.532 23880 1962 94.36 0.1791 0.2025 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.599 50.000 96.700 0.084 ? 15.600 3.800 ? 24414 ? ? 16.2502146055
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.599 1.630 88.300 ? ? ? 3.000 1095
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 4.2.2 0.97872, 0.97918, 0.96487 ALS 4.2.2
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
HKL-2000 data collection .
HKL-2000 data scaling .
SOLVE phasing .
PDB_EXTRACT data extraction 3.15
HKL-2000 data reduction .
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