X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 295 100 mM MES, 30% PEG 200, 5% PEG 3000, 1mM MnCl2, 10 mM AMPCPP, 10mM gentamicin C1
Unit Cell:
a: 40.580 Å b: 46.030 Å c: 89.000 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.11 Solvent Content: 41.72
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS FREE R-VALUE 1.5000 31.9930 27371 1409 99.8500 0.1487 0.1741 18.5920
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.490 46.030 99.700 0.056 ? 31.100 17.200 ? 27966 ? ? 12.880
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.490 1.530 96.700 ? ? 2.700 4.800 1968
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 93 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.541780 ? ?
Software
Software Name Purpose Version
PHENIX refinement .
StructureStudio data collection 2.2.1
xia2 data scaling 0.3.7.0
XSCALE data scaling .
XDS data reduction .
PDB_EXTRACT data extraction 3.15
PHENIX phasing .
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