X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 93 K | ? |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | RIGAKU MICROMAX-007 HF | 1.541780 | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| PHENIX | refinement | . |
| StructureStudio | data collection | 2.2.1 |
| xia2 | data scaling | 0.3.7.0 |
| XDS | data reduction | . |
| XSCALE | data scaling | . |
| PHASER | phasing | 2.5.6 |
| PDB_EXTRACT | data extraction | 3.15 |
