X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 289 20% PEG 400, 200mM Mg(AC)2, 100mM NaAC, pH 5.6
Unit Cell:
a: 66.951 Å b: 66.951 Å c: 112.831 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 32
Crystal Properties:
Matthew's Coefficient: 2.34 Solvent Content: 47.44
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.0010 40.4340 11253 538 99.5400 0.1918 0.2419 111.1500
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.000 50.000 99.800 0.055 ? 12.500 5.800 ? 11302 ? ? 79.800
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.000 3.110 99.700 ? ? 4.1 5.800 1120
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.9641 SSRF BL17U
Software
Software Name Purpose Version
DENZO data collection .
HKL-2000 data scaling .
PHENIX refinement (phenix.refine: 1.7.1_743)
PDB_EXTRACT data extraction 3.15
HKL-2000 data reduction .
PHASER phasing .