X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 289 17-22% PEG 3350, 150mM NaCl, 100mM NaAC pH 5.6
Unit Cell:
a: 62.962 Å b: 38.307 Å c: 102.130 Å α: 90.000° β: 95.540° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.38 Solvent Content: 48.37
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.5020 37.7340 32433 1629 98.8500 0.2172 0.2699 89.1100
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.500 50.000 99.800 0.075 ? 12.400 7.300 ? 34100 ? ? 53.070
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.500 2.590 100.000 ? ? 4.9 7.500 1687
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.9790 SSRF BL17U
Software
Software Name Purpose Version
DENZO data collection .
HKL-2000 data scaling .
PHENIX refinement (phenix.refine: 1.7.1_743)
PDB_EXTRACT data extraction 3.15
HKL-2000 data reduction .
PHENIX phasing .
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