5C94

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291 0.18 M ammonium sulfate, 0.1 M sodium cacodylate trihydrate pH 6.5, 28%(w/v) polyethylene glycol 8000
Unit Cell:
a: 123.426 Å b: 123.426 Å c: 123.426 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 4 3 2
Crystal Properties:
Matthew's Coefficient: 3.18 Solvent Content: 61.31
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? FREE R-VALUE 2.4380 22.5340 6258 290 99.6200 0.1894 0.2361 34.9200
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.438 22.534 98.8 0.089 ? 0.164 12.4 ? 6258 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.438 3.070 91.2 ? ? 2.4 2.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 1.5418 ? ?
Software
Software Name Purpose Version
HKL-2000 data scaling .
PHENIX refinement 1.8.4_1496
PDB_EXTRACT data extraction 3.15
HKL-2000 data reduction .
PHASER phasing .