X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 289 15% (v/v) tacsimate pH 7.0, 0.1 M HEPES pH 7.0, 2% (w/v) polyethylene glycol 3350
Unit Cell:
a: 189.928 Å b: 194.979 Å c: 179.844 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 5.58 Solvent Content: 77.97
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 3.4010 45.3500 45999 2326 99.8500 0.2203 0.2663 151.5700
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.400 50.000 100.000 0.086 ? 9.600 7.500 ? 46052 ? ? 109.910
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.400 3.460 100.000 ? ? ? 7.400 2236
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.984 SSRF BL17U
Software
Software Name Purpose Version
HKL-3000 data scaling .
PHENIX refinement 1.7.1_743
PDB_EXTRACT data extraction 3.15
HKL-3000 data reduction .
PHENIX phasing .
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