X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.2 298 Tris-HCl; MgAcetate; PEG400
Unit Cell:
a: 96.600 Å b: 114.420 Å c: 145.590 Å α: 68.440° β: 73.270° γ: 68.670°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 5.31 Solvent Content: 76.84
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR FREE R-VALUE 2.9000 27.9280 102593 5133 87.1900 0.2333 0.2671 80.7514
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.9 30 87.2 0.106 ? 8.900 12 ? 206754 ? -3.000 71.640
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.90 2.97 23 ? ? 1.340 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 1.0 SLS X06SA
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing .
PHENIX refinement .
PDB_EXTRACT data extraction 3.15
XDS data reduction .