X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 298 K | ? |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| SYNCHROTRON | ALS BEAMLINE 8.3.1 | 0.987, 0.988, 1.0 | ALS | 8.3.1 |
| Software Name | Purpose | Version |
|---|---|---|
| PHENIX | refinement | 1.8.2_1309 |
| HKL-2000 | data collection | 2.6 |
| PHENIX | model building | 1.8.2_1309 |
| Coot | data processing | 0.8.1.1 |
| XDS | data reduction | IA32 |
| Coot | phasing | 0.8.1.1 |
| HKL-2000 | data extraction | 2.6 |
