X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 100mM HEPES, pH 7.5, 50mM NaCl, 8% PEG8000
Unit Cell:
a: 132.766 Å b: 57.365 Å c: 46.646 Å α: 90.000° β: 98.710° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.86 Solvent Content: 57.00
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? FREE R-VALUE 1.5700 18.9220 47321 2367 97.6500 0.1647 0.1860 36.0886
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.57 50 97.6 0.04 ? 27 4.1 ? 47321 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.57 1.60 84.5 ? ? 1.0 2.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 1.03316 APS 23-ID-B
Software
Software Name Purpose Version
PHENIX refinement 1.8.1_1168
HKL-2000 data collection .
PDB_EXTRACT data extraction 3.15
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing (phenix.refine: 1.8.1_1168)