X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.8 298 20 mM Tris, 0.2 M Ammonium tartrate dibasic, 20% w/v Polyethylene glycol 3350
Unit Cell:
a: 50.200 Å b: 79.610 Å c: 93.320 Å α: 94.790° β: 103.310° γ: 105.560°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.73 Solvent Content: 55.05
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.6500 29.8400 154063 1990 95.6400 0.1639 0.1863 33.2757
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.650 ? 95.700 0.103 ? 9.190 ? ? 154186 ? -3.000 22.930
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.650 1.750 89.200 ? ? 1.960 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.5418 ? ?
Software
Software Name Purpose Version
PHENIX refinement 1.9_1692
XSCALE data scaling .
PHASER phasing .
PDB_EXTRACT data extraction 3.15
XDS data reduction .
Coot model building 0.82pre