ISDA: 5BWE

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	8.5	291	2:1 8 mg/mL BSS-alpha-beta-gamma (in 50 mM Tris, pH 7.6, 15% v/v glycerol, 200 mM sodium chloride) to well solution (25% w/v PEG3350, 100 mM Tris, pH 8.5, 60 mM potassium chloride, 5 mM fumarate), 1-2 uL toluene was added to the bottom of the well and allowed to diffuse slowly into the protein drop, diffraction-quality crystals grew over the course of three weeks in a temperature-controlled anaerobic chamber

Unit Cell:

a: 141.534 Å b: 115.360 Å c: 121.701 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 21 21 2

Crystal Properties:

Matthew's Coefficient: 2.15 Solvent Content: 42.91

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	3.300	38.270	30205	1809	98.64	0.2133	0.2366	?

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
3.30	40	98.9	?	0.101	9.6	3.8	?	30311	?	?	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	3.30	3.36	95.4	?	?	1.3	3.5	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	NSLS BEAMLINE X26C	1.00000	NSLS	X26C

Software